To measure the difference between the reference plane and actual plane of device in operation. This is used in a semiconductor fab equipment to measure the drift in the wafer plate and the reference plane. Its cable of measuring 0.001 degree title and shows the result on the mobile App within few hundred mill seconds.
Board Design and Development (Schematics and Layout Design).
Stabilization Algorithm, Driver Development, Blue tooth and IMU Interface.
Mobile APP design and Development.